Phenom ProX Desktop Scanning Electron Microscope

    The unique design allows the use of desktop scanning electron microscope Phenom to solve a large number of different problems in materials science, quality control in production, forensics, pharmaceuticals, research problems in biology and for the training of students and professionals.

    Phenom ProX Desktop Scanning Electron Microscope

     

    Key Specifications:

    IMAGING MODES

    Light optical

    Magnifi cation range: 20 - 135x

    Electron optical

    Magnifi cation range: 80 - 100,000x

    Acceleration Voltages 

    5 kV, 10 kV and 15 kV

    Resolution

    ≤ 17 nm

    Sample stage

    Computer-controlled motorized X and Y

    Sample size

    Up to 32 mm (Ø) Up to 100 mm (h)

    EDS SPECIFICATIONS

    Detector type

    Silicon Drift Detector (SDD), Thermoelectrically cooled (LN2 free)

    Detector active Area

    25 mm2 

    X-ray window

    Ultra-thin Silicon Nitride (Si3 N4 )

    Window allowing detection of elements

    C to Am